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GGB射頻探針選型 適用 40A,40M,50A,67A,110H 以下以40A為例： 40A-GSG-150-P-W 40A 指的是探針最高測(cè)試的頻率能力，40A代表此探針最高可測(cè)試到 40GHz            （40M為超低損耗探針） GSG 指的是探針對(duì)應(yīng)的電極數(shù)量，可選GSG,GS,SG幾種形狀。還有多個(gè)探針組合的可看dual選型方法 150 指的是探針腳間距，G和S間的距離；間距可從25um到2540um可選 P  

Use of probe station 1. Load the sample into the vacuum chuck and turn on the vacuum valve control switch to make the sample securely and firmly adsorbed on the chuck. 2. Use the chuck X-axis / Y-axis control knob to move the chuck platform, and see the sample clearly under the microscope's low magnification objective lens. 3. Use the chuck X-axis / Y-axis control knob to move the ch

Classification of probes Regarding the field survey used in electrical measurement, it is generally divided into the following categories to give you a detailed description I. Overview: The test pin is a probe for testing PCBA, which is mainly used as the input of electrical signals. The surface is gold-plated, and the inside has a high-performance spring with an average life of

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