CM-4 mini probe station
Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box
CS-4 small probe station
Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box
CL-6 middle-sized probe station
Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.
CH-8-D
CINDBEST CH-8-D 雙面點(diǎn)針探針臺(tái)可用于晶圓和PCB板測(cè)試，用于需要正面和背面同時(shí)扎針，以實(shí)現(xiàn)各種光/電性能測(cè)試需求的測(cè)試設(shè)備。該定制探針臺(tái)具有優(yōu)良的機(jī)械系統(tǒng)，穩(wěn)定的結(jié)構(gòu)，符合人體工程學(xué)，以及多項(xiàng)升級(jí)功能。可廣泛應(yīng)用于集成電路、Wafer ， LED、LCD、太陽(yáng)能電池等行業(yè)的制造和研究領(lǐng)域。
CH-8 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes
CH-12 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,
CT-6 non-vacuum high and low temperature probe station
Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.
PCB自動(dòng)測(cè)試系統(tǒng)
